@article{04a003cbf18a4c8899ff7bdd42c40ba5,
title = "Determination of characteristic magnetotransistor parameters by measurement and inverse modelling",
abstract = "We report on the development and validation of a methodology that allows the easy, reliable and destruction-free extraction of characteristic magnetotransistor parameters from the completely processed devices. The required experimental set-up is inexpensive, easy to build up and integrable in existing parameter analyser systems. The proposed evaluation methods have been verified on the basis of measurements as well as on exact two-dimensional numerical simulations. Implementation in a suitable parameter extraction software will allow standardized and automated measurements to be carried out.",
author = "G. Wachutka and C. Riccobene and R. Castagnetti and H. Baltes",
note = "Funding Information: The authors would like to thank Professor W Gerlach and P Frommmg (Institute of Matenals m Electrical Engmeermg, Techmcal University Berlin, Germany) for their assistancem, parttcularf or supply-mg valuable mformatrona bout the experrmentasl et-up and the bastet heory of the OBCD method They are also grateful to D Bono11a nd S Colombo for installing and testinga prehmmaryv ersion of a newly designede xperrmentasl et-up The numerical slmula-trons have been consrderablyf acthtatedb y the support of J Burgler (Integrated Systems Laboratory, Swiss Federal Instrtute of Technology, Zurich) The financial support of the Corm&tee for the Advancement of SctentrficR esearch(KWF) is gratefully acknowledged",
year = "1993",
doi = "10.1016/0924-4247(93)80028-F",
language = "English",
volume = "37-38",
pages = "158--166",
journal = "Sensors and Actuators, A: Physical",
issn = "0924-4247",
publisher = "Elsevier B.V.",
number = "C",
}