Design of low-voltage bandgap reference circuits in multi-gate CMOS technologies

M. Fulde, M. Wirnshofer, G. Knoblinger, D. Schmitt-Landsiedel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

This paper presents design considerations and measurement results for low voltage bandgap reference circuits in a recent multi-gate CMOS technology. Gated p-i-n diodes are used as basic elements, a corresponding model covering temperature dependence is derived. The impact of non-idealities and process variations on circuit performance is analyzed, design guidelines are derived. Low gds of current source transistors, low Op-Amp offset and sufficient gain are identified as main parameters for optimization of multi-gate bandgap performance. The feasibility of low voltage bandgap references in multi-gate technology is proven by measurement results. Bandgap references with PSRR of 40dB and TC of 56μV/°C are shown.

Original languageEnglish
Title of host publication2009 IEEE International Symposium on Circuits and Systems, ISCAS 2009
Pages2537-2540
Number of pages4
DOIs
StatePublished - 2009
Event2009 IEEE International Symposium on Circuits and Systems, ISCAS 2009 - Taipei, Taiwan, Province of China
Duration: 24 May 200927 May 2009

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2009 IEEE International Symposium on Circuits and Systems, ISCAS 2009
Country/TerritoryTaiwan, Province of China
CityTaipei
Period24/05/0927/05/09

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