TY - GEN
T1 - Design methodology innovations address manufacturing technology challenges
T2 - Proceedings of the EUROMICRO Systems on Digital System Design, DSD 2004
AU - Schlichtmann, Ulf
PY - 2004
Y1 - 2004
N2 - Semiconductor design has benefited tremendously from process technology scaling in the past, especially for power consumption and performance. This era is coming to an end. Continued improvement in these key metrics requires even more innovation in design methodology and design automation than in the past. Power consumption increasingly is becoming the most important bottleneck in the design of ICs in advanced process technologies. An evaluation of the use ultra-low threshold voltage (Vth) devices for power reduction in an advanced process technology is described. It turns out that in contrast to older process technologies, this approach increasingly is becoming less suitable for industrial usage in advanced process technologies. Thus, design methodologies are described which can reduce power consumption by optimizations in logic design, specifically by utilizing multiple levels of supply voltage V dd and threshold voltage Vth. The next major challenge on the horizon is increasing variability, both in the manufacturing process and in operating conditions. The need for statistical approaches to counter rising variability is described.
AB - Semiconductor design has benefited tremendously from process technology scaling in the past, especially for power consumption and performance. This era is coming to an end. Continued improvement in these key metrics requires even more innovation in design methodology and design automation than in the past. Power consumption increasingly is becoming the most important bottleneck in the design of ICs in advanced process technologies. An evaluation of the use ultra-low threshold voltage (Vth) devices for power reduction in an advanced process technology is described. It turns out that in contrast to older process technologies, this approach increasingly is becoming less suitable for industrial usage in advanced process technologies. Thus, design methodologies are described which can reduce power consumption by optimizations in logic design, specifically by utilizing multiple levels of supply voltage V dd and threshold voltage Vth. The next major challenge on the horizon is increasing variability, both in the manufacturing process and in operating conditions. The need for statistical approaches to counter rising variability is described.
UR - http://www.scopus.com/inward/record.url?scp=13944258111&partnerID=8YFLogxK
U2 - 10.1109/DSD.2004.1333258
DO - 10.1109/DSD.2004.1333258
M3 - Conference contribution
AN - SCOPUS:13944258111
SN - 0769522033
SN - 9780769522036
T3 - Proceedings of the EUROMICRO Systems on Digital System Design, DSD 2004
SP - 52
EP - 59
BT - Proceedings of the EUROMICRO Systems on Digital System Design, DSD 2004
A2 - Selvaraj, H.
Y2 - 31 August 2004 through 3 September 2004
ER -