TY - GEN
T1 - Design methodologies for enabling self-awareness in autonomous systems
AU - Sadighi, Armin
AU - Donyanavard, Bryan
AU - Kadeed, Thawra
AU - Moazzemi, Kasra
AU - Muck, Tiago
AU - Nassar, Ahmed
AU - Rahmani, Amir M.
AU - Wild, Thomas
AU - Dutt, Nikil
AU - Ernst, Rolf
AU - Herkersdorf, Andreas
AU - Kurdahi, Fadi
N1 - Publisher Copyright:
© 2018 EDAA.
PY - 2018/4/19
Y1 - 2018/4/19
N2 - This paper deals with challenges and possible solutions for incorporating self-awareness principles in EDA design flows for autonomous systems. We present a holistic approach that enables self-awareness across the software/hardware stack, from systems-on-chip to systems-of-systems (autonomous car) contexts. We use the Information Processing Factory (IPF) metaphor as an exemplar to show how self-awareness can be achieved across multiple abstraction levels, and discuss new research challenges. The IPF approach represents a paradigm shift in platform design by envisioning the move towards a consequent platform-centric design in which the combination of self-organizing learning and formal reactive methods guarantee the applicability of such cyber-physical systems in safety-critical and high-availability applications.
AB - This paper deals with challenges and possible solutions for incorporating self-awareness principles in EDA design flows for autonomous systems. We present a holistic approach that enables self-awareness across the software/hardware stack, from systems-on-chip to systems-of-systems (autonomous car) contexts. We use the Information Processing Factory (IPF) metaphor as an exemplar to show how self-awareness can be achieved across multiple abstraction levels, and discuss new research challenges. The IPF approach represents a paradigm shift in platform design by envisioning the move towards a consequent platform-centric design in which the combination of self-organizing learning and formal reactive methods guarantee the applicability of such cyber-physical systems in safety-critical and high-availability applications.
UR - https://www.scopus.com/pages/publications/85048831182
U2 - 10.23919/DATE.2018.8342259
DO - 10.23919/DATE.2018.8342259
M3 - Conference contribution
AN - SCOPUS:85048831182
T3 - Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
SP - 1532
EP - 1537
BT - Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Y2 - 19 March 2018 through 23 March 2018
ER -