TY - GEN
T1 - Design-for-testability for continuous-flow microfluidic biochips
AU - Liu, Chunfeng
AU - Li, Bing
AU - Ho, Tsung Yi
AU - Chakrabarty, Krishnendu
AU - Schlichtmann, Ulf
N1 - Publisher Copyright:
© 2018 Association for Computing Machinery.
PY - 2018/6/24
Y1 - 2018/6/24
N2 - Flow-based microfluidic biochips are gaining traction in the microfluidics community since they enable efficient and low-cost biochemical experiments. These highly integrated lab-on-a-chip systems, however, suffer from manufacturing defects, which cause some chips to malfunction. To test biochips after manufacturing, air pressure is applied to input ports of a chip and predetermined test vectors are used to change the states of microvalves in the chip. Pressure meters are connected to the output ports to measure pressure values, which are compared with expected values to detect errors. To reduce the cost of the test platform, the number of pressure sources and meters should be reduced. We propose a design-for-testability (DFT) technique that enables a test procedure with only a single pressure source and a single pressure meter. Furthermore, the valves inserted for DFT share control channels with valves in the original chip so that no additional control signals are required. Simulation results demonstrate that this technique can generate efficient chip architectures for single-source single-meter test in all experiment cases successfully to reduce test cost, while the performance of these chips in executing applications is still maintained.
AB - Flow-based microfluidic biochips are gaining traction in the microfluidics community since they enable efficient and low-cost biochemical experiments. These highly integrated lab-on-a-chip systems, however, suffer from manufacturing defects, which cause some chips to malfunction. To test biochips after manufacturing, air pressure is applied to input ports of a chip and predetermined test vectors are used to change the states of microvalves in the chip. Pressure meters are connected to the output ports to measure pressure values, which are compared with expected values to detect errors. To reduce the cost of the test platform, the number of pressure sources and meters should be reduced. We propose a design-for-testability (DFT) technique that enables a test procedure with only a single pressure source and a single pressure meter. Furthermore, the valves inserted for DFT share control channels with valves in the original chip so that no additional control signals are required. Simulation results demonstrate that this technique can generate efficient chip architectures for single-source single-meter test in all experiment cases successfully to reduce test cost, while the performance of these chips in executing applications is still maintained.
UR - http://www.scopus.com/inward/record.url?scp=85052082320&partnerID=8YFLogxK
U2 - 10.1145/3195970.3196025
DO - 10.1145/3195970.3196025
M3 - Conference contribution
AN - SCOPUS:85052082320
SN - 9781450357005
T3 - Proceedings - Design Automation Conference
BT - Proceedings of the 55th Annual Design Automation Conference, DAC 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 55th Annual Design Automation Conference, DAC 2018
Y2 - 24 June 2018 through 29 June 2018
ER -