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Design Centering by Yield Prediction
Kurt J. Antreich
, Rudolf K. Koblitz
Chair of Electronic Design Automation
Technical University of Munich
Research output
:
Contribution to journal
›
Article
›
peer-review
72
Scopus citations
Overview
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Dive into the research topics of 'Design Centering by Yield Prediction'. Together they form a unique fingerprint.
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Engineering
Optimization Method
100%
Switched Capacitor Filters
100%
Circuit Parameter
100%
Iteration Step
100%
Component Tolerance
100%
Component Value
100%
Monte Carlo Analysis
100%
Maximization
100%
Electrical Circuit
100%
Design Tool
100%
Keyphrases
Yield Prediction
100%
Design Centering
100%
Prediction Formula
100%
Nominal Value
66%
Optimization Methods
33%
Design Tools
33%
Importance Sampling
33%
Electrical Circuits
33%
Circuit Parameters
33%
Analytical Approximation
33%
Interactive Optimization
33%
Monte Carlo Analysis
33%
Fewer Iterations
33%
Yield Maximization
33%
Appropriate Design
33%
Yield Improvement
33%
Variance Prediction
33%
Problem Diagnosis
33%
Circuit Yield
33%
Component Tolerance
33%
Switched-capacitor Filter
33%
Quantitative Problem
33%