Design and optimization of vertical CEO-T-FETs with atomically precise ultrashort gates by simulation with quantum transport models

J. Höntschel, W. Klix, R. Stenzel, F. Ertl, G. Abstreiter

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The cleaved-edge overgrowth (CEO) technique offers an innovative approach to designing novel quantum sized field-effect transistors (FETs) with a T-like gate-to-channel structure. Numerical simulations of vertical CEO-T-FETs have been carried out to optimize the structure and predict device performance. For the simulation the 2D/3D device simulator SIMBA is used, which is capable of dealing with complex device geometries as well as with several physical models represented by certain sets of partial differential equations.

Original languageEnglish
Title of host publicationPHYSICS OF SEMICONDUCTORS
Subtitle of host publication27th International Conference on the Physics of Semiconductors, ICPS-27
Pages1501-1502
Number of pages2
DOIs
StatePublished - 30 Jun 2005
EventPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 - Flagstaff, AZ, United States
Duration: 26 Jul 200430 Jul 2004

Publication series

NameAIP Conference Proceedings
Volume772
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferencePHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27
Country/TerritoryUnited States
CityFlagstaff, AZ
Period26/07/0430/07/04

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