TY - GEN
T1 - Dependency of Nonlinearity on Design Parameters in SAW Devices
AU - Forster, Thomas
AU - Chauhan, Vikrant
AU - Mayer, Markus
AU - Mayer, Elena
AU - Mayer, Andreas
AU - Ebner, Thomas
AU - Wagner, Karl
AU - Hagelauer, Amelie
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - This work focuses on the dependencies between typical design parameters of surface acoustic wave (SAW) resonators and the nonlinear emitted signals of second and third order. The parameters metalization ratio and pitch are used as examples, but the approach can be extended to other design parameters as well. It is shown, that the interaction between the nonlinear current generation and the linear admittance is defining the measured nonlinear power signals. It is also discussed, that changes in linear properties get more pronounced in nonlinear responses. Therefore, slight effects on linear parameters will have significant influence on the observed nonlinearity.
AB - This work focuses on the dependencies between typical design parameters of surface acoustic wave (SAW) resonators and the nonlinear emitted signals of second and third order. The parameters metalization ratio and pitch are used as examples, but the approach can be extended to other design parameters as well. It is shown, that the interaction between the nonlinear current generation and the linear admittance is defining the measured nonlinear power signals. It is also discussed, that changes in linear properties get more pronounced in nonlinear responses. Therefore, slight effects on linear parameters will have significant influence on the observed nonlinearity.
UR - http://www.scopus.com/inward/record.url?scp=85137177390&partnerID=8YFLogxK
U2 - 10.1109/IC-MAM55200.2022.9855283
DO - 10.1109/IC-MAM55200.2022.9855283
M3 - Conference contribution
AN - SCOPUS:85137177390
T3 - IEEE MTT-S International Conference on Microwave Acoustics and Mechanics, IC-MAM 2022
SP - 33
EP - 36
BT - IEEE MTT-S International Conference on Microwave Acoustics and Mechanics, IC-MAM 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 1st IEEE MTT-S International Conference on Microwave Acoustics and Mechanics, IC-MAM 2022
Y2 - 18 July 2022 through 20 July 2022
ER -