TY - GEN
T1 - Dependable embedded systems
T2 - 2012 17th IEEE European Test Symposium, ETS 2012
AU - Henkel, Jörg
AU - Bringmann, Oliver
AU - Herkersdorf, Andreas
AU - Rosenstiel, Wolfgang
AU - Wehn, Norbert
PY - 2012
Y1 - 2012
N2 - When migrating to future technology nodes, dependability becomes a major design problem as variability, aging and susceptibility to soft errors increase. The purpose of this program is to research cross-layer solutions that address the physical problems at system-level i.e. at hardware-level, operating system level, application level etc. The goals and an overview of the DFG SPP 1500 research program are presented.
AB - When migrating to future technology nodes, dependability becomes a major design problem as variability, aging and susceptibility to soft errors increase. The purpose of this program is to research cross-layer solutions that address the physical problems at system-level i.e. at hardware-level, operating system level, application level etc. The goals and an overview of the DFG SPP 1500 research program are presented.
KW - dependability
KW - embedded systems
KW - reliability
UR - http://www.scopus.com/inward/record.url?scp=84864655412&partnerID=8YFLogxK
U2 - 10.1109/ETS.2012.6233053
DO - 10.1109/ETS.2012.6233053
M3 - Conference contribution
AN - SCOPUS:84864655412
SN - 9781467306973
T3 - Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012
BT - Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012
Y2 - 28 May 2012 through 1 June 2012
ER -