Defect density and structure of hydrogenated amorphous silicon-sulfur alloys

S. Aljishi, M. Stutzmann, Shu Jin, C. Herrero, S. Al-Dallal, M. Hammam, S. M. Al-Alawi

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

The electronic and structural properties of a-Si, S:H alloys are investigated. Results show that the incorporation of sulfur leads to an increase in the bandgap, an increase in bonding disorder (manifested as an increase in the width of the Raman TO phonon peak and an increase in the Urbach slope), changes in the hydrogen bonding configurations, and an increase in the total defect density. The dark and photo- conductivities of a-Si, S:H alloys are similar to those of a-Si, C:H alloys at comparable bandgap energies.

Original languageEnglish
Pages (from-to)462-464
Number of pages3
JournalJournal of Non-Crystalline Solids
Volume114
Issue numberPART 2
DOIs
StatePublished - 2 Dec 1989
Externally publishedYes

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