Deconvolution of an SoC- and SoH-Dependent Contact Resistance in a Multilayer Pouch Cell Using Impedance Spectroscopy

Simon Helmer; Robert Morasch; Philip Rapp; Sven Friedrich; Andreas Jossen; Hubert A. Gasteiger

doi:10.1149/1945-7111/ae2402

Deconvolution of an SoC- and SoH-Dependent Contact Resistance in a Multilayer Pouch Cell Using Impedance Spectroscopy

Simon Helmer
, Robert Morasch
, Philip Rapp
, Sven Friedrich
, Andreas Jossen
, Hubert A. Gasteiger

Technical University of Munich

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Highlights Inductive effects in large cells mask high-frequency features, resulting in R hf , app . Method corrects inductive artifacts to estimate true high-frequency resistance. Contact resistance varies with SoC; in large cells it appears as R hf , app shift. R hf , app increase during aging mainly reflects rising cathode contact resistance.

Original language	English
Article number	010504
Journal	Journal of the Electrochemical Society
Volume	173
Issue number	1
DOIs	https://doi.org/10.1149/1945-7111/ae2402
State	Published - 14 Jan 2026

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This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Keywords

SoC analysis
SoH analysis
contact resistance
electrochemical impedance spectroscopy (EIS)
high-frequency resistance
inductive artifacts
large-format cells

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10.1149/1945-7111/ae2402

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title = "Deconvolution of an SoC- and SoH-Dependent Contact Resistance in a Multilayer Pouch Cell Using Impedance Spectroscopy",

abstract = "Highlights Inductive effects in large cells mask high-frequency features, resulting in R hf , app . Method corrects inductive artifacts to estimate true high-frequency resistance. Contact resistance varies with SoC; in large cells it appears as R hf , app shift. R hf , app increase during aging mainly reflects rising cathode contact resistance.",

keywords = "SoC analysis, SoH analysis, contact resistance, electrochemical impedance spectroscopy (EIS), high-frequency resistance, inductive artifacts, large-format cells",

author = "Simon Helmer and Robert Morasch and Philip Rapp and Sven Friedrich and Andreas Jossen and Gasteiger, \{Hubert A.\}",

note = "Publisher Copyright: {\textcopyright} 2026 The Author(s). Published on behalf of The Electrochemical Society by IOP Publishing Limited.",

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doi = "10.1149/1945-7111/ae2402",

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AU - Helmer, Simon

AU - Morasch, Robert

AU - Rapp, Philip

AU - Friedrich, Sven

AU - Jossen, Andreas

AU - Gasteiger, Hubert A.

PY - 2026/1/14

Y1 - 2026/1/14

N2 - Highlights Inductive effects in large cells mask high-frequency features, resulting in R hf , app . Method corrects inductive artifacts to estimate true high-frequency resistance. Contact resistance varies with SoC; in large cells it appears as R hf , app shift. R hf , app increase during aging mainly reflects rising cathode contact resistance.

AB - Highlights Inductive effects in large cells mask high-frequency features, resulting in R hf , app . Method corrects inductive artifacts to estimate true high-frequency resistance. Contact resistance varies with SoC; in large cells it appears as R hf , app shift. R hf , app increase during aging mainly reflects rising cathode contact resistance.

KW - SoC analysis

KW - SoH analysis

KW - contact resistance

KW - electrochemical impedance spectroscopy (EIS)

KW - high-frequency resistance

KW - inductive artifacts

KW - large-format cells

UR - https://www.scopus.com/pages/publications/105033787810

U2 - 10.1149/1945-7111/ae2402

DO - 10.1149/1945-7111/ae2402

M3 - Article

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SN - 0013-4651

VL - 173

JO - Journal of the Electrochemical Society

JF - Journal of the Electrochemical Society

IS - 1

M1 - 010504

ER -

Deconvolution of an SoC- and SoH-Dependent Contact Resistance in a Multilayer Pouch Cell Using Impedance Spectroscopy

Abstract

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Keywords

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