TY - GEN
T1 - Debugging of toffoli networks
AU - Wille, Robert
AU - Große, Daniel
AU - Frehse, Stefan
AU - Dueck, Gerhard W.
AU - Drechsler, Rolf
PY - 2009
Y1 - 2009
N2 - Intensive research is performed to find post-CMOS technologies. A very promising direction based on reversible logic are quantum computers. While in the domain of reversible logic synthesis, testing, and verification have been investigated, debugging of reversible circuits has not yet been considered. The goal of debugging is to determine gates of an erroneous circuit that explain the observed incorrect behavior. In this paper we propose the first approach for automatic debugging of reversible Toffoli networks. Our method uses a formulation for the debugging problem based on Boolean satisfiability. We show the differences to classical (irreversible) debugging and present theoretical results. These are used to speed-up the debugging approach as well as to improve the resulting quality. Our method is able to find and to correct single errors automatically.
AB - Intensive research is performed to find post-CMOS technologies. A very promising direction based on reversible logic are quantum computers. While in the domain of reversible logic synthesis, testing, and verification have been investigated, debugging of reversible circuits has not yet been considered. The goal of debugging is to determine gates of an erroneous circuit that explain the observed incorrect behavior. In this paper we propose the first approach for automatic debugging of reversible Toffoli networks. Our method uses a formulation for the debugging problem based on Boolean satisfiability. We show the differences to classical (irreversible) debugging and present theoretical results. These are used to speed-up the debugging approach as well as to improve the resulting quality. Our method is able to find and to correct single errors automatically.
UR - http://www.scopus.com/inward/record.url?scp=70350059427&partnerID=8YFLogxK
U2 - 10.1109/date.2009.5090863
DO - 10.1109/date.2009.5090863
M3 - Conference contribution
AN - SCOPUS:70350059427
SN - 9783981080155
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1284
EP - 1289
BT - Proceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
Y2 - 20 April 2009 through 24 April 2009
ER -