DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing

Tilmann Rabl; Kaiwen Zhang; Mohammad Sadoghi; Navneet Kumar Pandey; Aakash Nigam; Chen Wang; Hans Arno Jacobsen

doi:10.1145/2335484.2335520

DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing

Tilmann Rabl
, Kaiwen Zhang
, Mohammad Sadoghi
, Navneet Kumar Pandey
, Aakash Nigam
, Chen Wang
, Hans Arno Jacobsen

Middleware Systems Research Group
University of Toronto
University of Oslo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

In this paper, we present an efficient complex event processing system tailored toward monitoring a large-scale setup of manufacturing equipment. In particular, the key challenge in the equipment monitoring is to develop an event-based system for computing complex manufacturing queries coupled with event notifications and event and query result visualization components. Furthermore, we present an experimental evaluation to validate the effectiveness of the proposed solution with respect to both query latency and throughput.

Original language	English
Title of host publication	Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12
Pages	335-340
Number of pages	6
DOIs	https://doi.org/10.1145/2335484.2335520
State	Published - 2012
Externally published	Yes
Event	6th ACM International Conference on Distributed Event-Based Systems, DEBS'12 - Berlin, Germany Duration: 16 Jul 2012 → 20 Jul 2012

Publication series

Name	Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12

Conference

Conference	6th ACM International Conference on Distributed Event-Based Systems, DEBS'12
Country/Territory	Germany
City	Berlin
Period	16/07/12 → 20/07/12

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Keywords

Complex event processing
DEBS grand challenge
Event processing architecture
Event storage
Publish/subscribe

Access to Document

10.1145/2335484.2335520

Cite this

Rabl, T., Zhang, K., Sadoghi, M., Pandey, N. K., Nigam, A., Wang, C., & Jacobsen, H. A. (2012). DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing. In Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12 (pp. 335-340). (Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12). https://doi.org/10.1145/2335484.2335520

Rabl, Tilmann ; Zhang, Kaiwen ; Sadoghi, Mohammad et al. / DEBS grand challenge : Solving manufacturing equipment monitoring through efficient complex event processing. Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12. 2012. pp. 335-340 (Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12).

@inproceedings{8b0c9dc38f8648f88e1364140fb6ed6f,

title = "DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing",

abstract = "In this paper, we present an efficient complex event processing system tailored toward monitoring a large-scale setup of manufacturing equipment. In particular, the key challenge in the equipment monitoring is to develop an event-based system for computing complex manufacturing queries coupled with event notifications and event and query result visualization components. Furthermore, we present an experimental evaluation to validate the effectiveness of the proposed solution with respect to both query latency and throughput.",

keywords = "Complex event processing, DEBS grand challenge, Event processing architecture, Event storage, Publish/subscribe",

author = "Tilmann Rabl and Kaiwen Zhang and Mohammad Sadoghi and Pandey, \{Navneet Kumar\} and Aakash Nigam and Chen Wang and Jacobsen, \{Hans Arno\}",

year = "2012",

doi = "10.1145/2335484.2335520",

language = "English",

isbn = "9781450313155",

series = "Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12",

pages = "335--340",

booktitle = "Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12",

note = "6th ACM International Conference on Distributed Event-Based Systems, DEBS'12 ; Conference date: 16-07-2012 Through 20-07-2012",

}

Rabl, T, Zhang, K, Sadoghi, M, Pandey, NK, Nigam, A, Wang, C & Jacobsen, HA 2012, DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing. in Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12. Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12, pp. 335-340, 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12, Berlin, Germany, 16/07/12. https://doi.org/10.1145/2335484.2335520

DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing. / Rabl, Tilmann; Zhang, Kaiwen; Sadoghi, Mohammad et al.
Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12. 2012. p. 335-340 (Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - DEBS grand challenge

T2 - 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12

AU - Rabl, Tilmann

AU - Zhang, Kaiwen

AU - Sadoghi, Mohammad

AU - Pandey, Navneet Kumar

AU - Nigam, Aakash

AU - Wang, Chen

AU - Jacobsen, Hans Arno

PY - 2012

Y1 - 2012

N2 - In this paper, we present an efficient complex event processing system tailored toward monitoring a large-scale setup of manufacturing equipment. In particular, the key challenge in the equipment monitoring is to develop an event-based system for computing complex manufacturing queries coupled with event notifications and event and query result visualization components. Furthermore, we present an experimental evaluation to validate the effectiveness of the proposed solution with respect to both query latency and throughput.

AB - In this paper, we present an efficient complex event processing system tailored toward monitoring a large-scale setup of manufacturing equipment. In particular, the key challenge in the equipment monitoring is to develop an event-based system for computing complex manufacturing queries coupled with event notifications and event and query result visualization components. Furthermore, we present an experimental evaluation to validate the effectiveness of the proposed solution with respect to both query latency and throughput.

KW - Complex event processing

KW - DEBS grand challenge

KW - Event processing architecture

KW - Event storage

KW - Publish/subscribe

UR - https://www.scopus.com/pages/publications/84865023979

U2 - 10.1145/2335484.2335520

DO - 10.1145/2335484.2335520

M3 - Conference contribution

AN - SCOPUS:84865023979

SN - 9781450313155

T3 - Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12

SP - 335

EP - 340

BT - Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12

Y2 - 16 July 2012 through 20 July 2012

ER -

Rabl T, Zhang K, Sadoghi M, Pandey NK, Nigam A, Wang C et al. DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing. In Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12. 2012. p. 335-340. (Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems, DEBS'12). doi: 10.1145/2335484.2335520

DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing

Abstract

Publication series

Conference

UN SDGs

Keywords

Access to Document

Other files and links

Fingerprint

Cite this