Abstract
X-ray scattering experiments within the region of total external reflection as well as grazing-incidence-diffraction measurements from Langmuir-Blodgett films are shown. All measurements are explained quantitatively using the distorted-wave Born approximation (small (Formula presented) regions) or a simple kinematic scattering theory (large (Formula presented) regions) for layered systems. Since rather imperfect systems are investigated, strong vertical correlations between the roughnesses of the organic layer interfaces were found for two samples consisting of 9 and 11 layers, respectively, of cadmium-arachidate on silicon (100) surfaces. This conformal roughness does not stem from the substrate but from defects and holes of the first transferred layer. The model of self-affine rough interfaces yields consistent parameters compared with grazing incidence diffraction experiments and no hints towards a cadmium-arachidate island formation are observed.
| Original language | English |
|---|---|
| Pages (from-to) | 5038-5050 |
| Number of pages | 13 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 54 |
| Issue number | 7 |
| DOIs | |
| State | Published - 1996 |