Correlation-induced photoemission delay in helium

M. Ossiander, F. Siegrist, V. Shirvanyan, R. Pazourek, A. Sommer, T. Latka, A. Guggenmos, U. Kleineberg, F. Krausz, R. Kienberger, M. Schultze

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We determined the photoemission timing of electrons escaping during shake-down and shake-up processes in helium with sub-attosecond standard error. Excellent agreement with ab-initio calculations allows benchmarking of theoretical models and identifies contributions of electronic correlation.

Original languageEnglish
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580118
StatePublished - 16 Dec 2016
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

Name2016 Conference on Lasers and Electro-Optics, CLEO 2016

Conference

Conference2016 Conference on Lasers and Electro-Optics, CLEO 2016
Country/TerritoryUnited States
CitySan Jose
Period5/06/1610/06/16

Fingerprint

Dive into the research topics of 'Correlation-induced photoemission delay in helium'. Together they form a unique fingerprint.

Cite this