Considerations for Capacitance Measurements of Antenna Tuning RF Switches on Board

Valentyn Solomko, Oguzhan Oezdamar, Danial Tayari, Matthias Voelkel, Simon Weiss, Jochen Essel, Robert Weigel, Amelie Hagelauer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The subject of the paper is accurate measurements of the OFF-state shunt capacitance of antenna tuning RF switch ICs (integrated circuits) assembled on printed-circuit boards. According to the proposed method, an empty (open) instance of the test fixture on which the IC under test is populated is measured and included into the de-embedded procedure in addition to or instead of a nominal de-embedding structure. Such approach allows improving the absolute accuracy, repeatability and reproducibility of the shunt OFF-capacitance measurements. The experiment conducted on a designed shunt antenna tuning switch with the nominal capacitance value of 160 fF demonstrated the improvement in accuracy and repeatability by a factor of 2.3 with the proposed method comparing to the conventional common de-embedding approach.

Original languageEnglish
Title of host publication2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages338-343
Number of pages6
ISBN (Electronic)9780738146720
DOIs
StatePublished - 2021
Externally publishedYes
Event2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2021 - Tel Aviv, Israel
Duration: 1 Nov 20213 Nov 2021

Publication series

Name2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2021

Conference

Conference2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2021
Country/TerritoryIsrael
CityTel Aviv
Period1/11/213/11/21

Keywords

  • Antenna tuning
  • Aperture tuning
  • De-embedding
  • High-voltage switch
  • Precise measurements
  • RF switch
  • Repeatability
  • Switch characterization

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