Confocal shift interferometry of coherent emission from trapped dipolar excitons

J. Repp, G. J. Schinner, E. Schubert, A. K. Rai, D. Reuter, A. D. Wieck, U. Wurstbauer, J. P. Kotthaus, A. W. Holleitner

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Abstract

We introduce a confocal shift-interferometer based on optical fibers. The presented spectroscopy allows measuring coherence maps of luminescent samples with a high spatial resolution even at cryogenic temperatures. We apply the spectroscopy onto electrostatically trapped, dipolar excitons in a semiconductor double quantum well. We find that the measured spatial coherence length of the excitonic emission coincides with the point spread function of the confocal setup. The results are consistent with a temporal coherence of the excitonic emission down to temperatures of 250 mK.

Original languageEnglish
Article number241101
JournalApplied Physics Letters
Volume105
Issue number24
DOIs
StatePublished - 15 Dec 2014

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