TY - GEN
T1 - Computational intelligence based testing for semiconductor measurement systems
AU - Liau, Eric
AU - Schmitt-Landsiedel, Doris
PY - 2005
Y1 - 2005
N2 - This paper describes a computational intelligence-based software configuration implemented on semiconductor automatic test equipment (ATE,) and how we can improve our design (e.g. memory test chip) based on such a method. The purpose of this unique software configuration incorporating neural network, genetic-algorithm and other artificial intelligence technologies is to enhance ATE capability and efficiency by providing an intelligent interface for a variety of functions that are controlled or monitored by the software. This includes automated and user directed control of the ATE and a diagnostic strategy to streamline test sequences and specific combinations of test conditions through the use of advanced diagnostic strategies. Such methods can achieve greater accuracy in failure diagnosis and fault prediction; and improve confidence in circuit performance testing that result in the determination of a DUT (device under test) status.
AB - This paper describes a computational intelligence-based software configuration implemented on semiconductor automatic test equipment (ATE,) and how we can improve our design (e.g. memory test chip) based on such a method. The purpose of this unique software configuration incorporating neural network, genetic-algorithm and other artificial intelligence technologies is to enhance ATE capability and efficiency by providing an intelligent interface for a variety of functions that are controlled or monitored by the software. This includes automated and user directed control of the ATE and a diagnostic strategy to streamline test sequences and specific combinations of test conditions through the use of advanced diagnostic strategies. Such methods can achieve greater accuracy in failure diagnosis and fault prediction; and improve confidence in circuit performance testing that result in the determination of a DUT (device under test) status.
UR - http://www.scopus.com/inward/record.url?scp=33847131361&partnerID=8YFLogxK
U2 - 10.1109/TEST.2005.1584056
DO - 10.1109/TEST.2005.1584056
M3 - Conference contribution
AN - SCOPUS:33847131361
SN - 0780390393
SN - 9780780390393
T3 - Proceedings - International Test Conference
SP - 906
EP - 915
BT - IEEE International Test Conference, Proceedings, ITC 2005
T2 - IEEE International Test Conference, ITC 2005
Y2 - 8 November 2005 through 10 November 2005
ER -