Compositional generation of MC/DC integration test suites

Alexander Pretschner

doi:10.1016/S1571-0661(04)81020-X

Compositional generation of MC/DC integration test suites

Alexander Pretschner

Informatics 4 - Chair of Software und Systems Engineering

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach.

Original language	English
Pages (from-to)	1-10
Number of pages	10
Journal	Electronic Notes in Theoretical Computer Science
Volume	82
Issue number	6
DOIs	https://doi.org/10.1016/S1571-0661(04)81020-X
State	Published - Sep 2003

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10.1016/S1571-0661(04)81020-X

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title = "Compositional generation of MC/DC integration test suites",

abstract = "We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach.",

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AB - We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach.

UR - https://www.scopus.com/pages/publications/18944378003

U2 - 10.1016/S1571-0661(04)81020-X

DO - 10.1016/S1571-0661(04)81020-X

M3 - Article

AN - SCOPUS:18944378003

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VL - 82

SP - 1

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JO - Electronic Notes in Theoretical Computer Science

JF - Electronic Notes in Theoretical Computer Science

IS - 6

ER -

Compositional generation of MC/DC integration test suites

Abstract

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