TY - JOUR
T1 - Compositional generation of MC/DC integration test suites
AU - Pretschner, Alexander
N1 - Funding Information:
1 Supported by the DFG (Be 1055/7-3); Fax +49 8928917307; Email [email protected]
PY - 2003/9
Y1 - 2003/9
N2 - We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach.
AB - We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach.
UR - http://www.scopus.com/inward/record.url?scp=18944378003&partnerID=8YFLogxK
U2 - 10.1016/S1571-0661(04)81020-X
DO - 10.1016/S1571-0661(04)81020-X
M3 - Article
AN - SCOPUS:18944378003
SN - 1571-0661
VL - 82
SP - 1
EP - 10
JO - Electronic Notes in Theoretical Computer Science
JF - Electronic Notes in Theoretical Computer Science
IS - 6
ER -