Abstract
The incorporation properties segregation, activation, and desorption in Si molecular beam epitaxy of phosphorus (P) are investigated experimentally in comparison to antimony (Sb) over a temperature range from 300 to 900°C with Secondary Ion Mass Spectroscopy and electrochemical Capacitance/Voltage measurements. P exhibits superior properties over the full temperature range.
Original language | English |
---|---|
Pages (from-to) | 937-940 |
Number of pages | 4 |
Journal | Journal of Applied Physics |
Volume | 78 |
Issue number | 2 |
DOIs | |
State | Published - 1995 |