TY - JOUR
T1 - Comparison of in-situ delay monitors for use in Adaptive Voltage Scaling
AU - Pour Aryan, N.
AU - Heiß, L.
AU - Schmitt-Landsiedel, D.
AU - Georgakos, G.
AU - Wirnshofer, M.
PY - 2012
Y1 - 2012
N2 - In Adaptive Voltage Scaling (AVS) the supply voltage of digital circuits is tuned according to the circuit's actual operating condition, which enables dynamic compensation to PVTA variations. By exploiting the excessive safety margins added in state-of-the-art worst-case designs considerable power saving is achieved. In our approach, the operating condition of the circuit is monitored by in-situ delay monitors. This paper presents different designs to implement the in-situ delay monitors capable of detecting late but still non-erroneous transitions, called Pre-Errors. The developed Pre-Error monitors are integrated in a 16 bit multiplier test circuit and the resulting Pre-Error AVS system is modeled by a Markov chain in order to determine the power saving potential of each Pre-Error detection approach.
AB - In Adaptive Voltage Scaling (AVS) the supply voltage of digital circuits is tuned according to the circuit's actual operating condition, which enables dynamic compensation to PVTA variations. By exploiting the excessive safety margins added in state-of-the-art worst-case designs considerable power saving is achieved. In our approach, the operating condition of the circuit is monitored by in-situ delay monitors. This paper presents different designs to implement the in-situ delay monitors capable of detecting late but still non-erroneous transitions, called Pre-Errors. The developed Pre-Error monitors are integrated in a 16 bit multiplier test circuit and the resulting Pre-Error AVS system is modeled by a Markov chain in order to determine the power saving potential of each Pre-Error detection approach.
UR - http://www.scopus.com/inward/record.url?scp=84880879643&partnerID=8YFLogxK
U2 - 10.5194/ars-10-215-2012
DO - 10.5194/ars-10-215-2012
M3 - Article
AN - SCOPUS:84880879643
SN - 1684-9965
VL - 10
SP - 215
EP - 220
JO - Advances in Radio Science
JF - Advances in Radio Science
ER -