Comparing Switching and Conduction Losses of Uni-and Bidirectional SiC Semiconductor Switches for AC Applications

Daniel Goldmann, Sebastian Mayer, Simon Schramm, Hans Georg Herzog

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The presented research elaborates on the increase in conduction and switching losses when combining two regular SiC MosFETs to one bidirectional switch. The conduction losses are expected to double due to two semiconductors conducting the current while the switching losses should increase since the loop inductance is increased. Both effects are directly investigated through extensive double pulse tests and conduction loss measurements. The measured conduction losses are significantly lower than expected while no increase in switching losses can be measured. These directly measured losses are further verified through efficiency measurements with a 15 kW dc-dc converter prototype.

Original languageEnglish
Title of host publication2021 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9789075815375
StatePublished - 6 Sep 2021
Event23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe - Ghent, Belgium
Duration: 6 Sep 202110 Sep 2021

Publication series

Name2021 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe

Conference

Conference23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe
Country/TerritoryBelgium
CityGhent
Period6/09/2110/09/21

Keywords

  • Converter circuit
  • Double pulse tests
  • Power semiconductor device
  • Switching losses
  • Wide bandgap devices

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