TY - GEN
T1 - Combination of thermal subsystems modeled by rapid circuit transformation
AU - Gerstenmaier, Y. C.
AU - Kiffe, W.
AU - Wachutka, G.
PY - 2007
Y1 - 2007
N2 - This paper will deal with the modeling-problem of combining thermal subsystems (e.g. a semiconductor module or package with a cooling radiator) making use of reduced models. The subsystem models consist of a set of Foster-type thermal equivalent circuits, which are only behavioral models. A fast algorithm is presented for transforming the Foster-type circuits in Cauer-circuits which have physical behavior and therefore allow for the construction of the thermal model of the complete system. Then the set of Cauer-circuits for the complete system is transformed back into Foster-circuits to give a simple mathematical representation and applicability. The transformation algorithms are derived in concise form by use of recursive relations. The method is exemplified by modeling and measurements on a single chip IGBT package mounted on a closed water cooled radiator. The thermal impedance of the complete system is constructed from the impedances of the sub-systems, IGBT-package and radiator, and also the impedance of the package can be inferred from the measured impedance of the complete system.
AB - This paper will deal with the modeling-problem of combining thermal subsystems (e.g. a semiconductor module or package with a cooling radiator) making use of reduced models. The subsystem models consist of a set of Foster-type thermal equivalent circuits, which are only behavioral models. A fast algorithm is presented for transforming the Foster-type circuits in Cauer-circuits which have physical behavior and therefore allow for the construction of the thermal model of the complete system. Then the set of Cauer-circuits for the complete system is transformed back into Foster-circuits to give a simple mathematical representation and applicability. The transformation algorithms are derived in concise form by use of recursive relations. The method is exemplified by modeling and measurements on a single chip IGBT package mounted on a closed water cooled radiator. The thermal impedance of the complete system is constructed from the impedances of the sub-systems, IGBT-package and radiator, and also the impedance of the package can be inferred from the measured impedance of the complete system.
UR - http://www.scopus.com/inward/record.url?scp=48049123511&partnerID=8YFLogxK
U2 - 10.1109/THERMINIC.2007.4451758
DO - 10.1109/THERMINIC.2007.4451758
M3 - Conference contribution
AN - SCOPUS:48049123511
SN - 9782355000027
T3 - Collection of Papers Presented at The 13th International Workshop on THERMal INvestigation of ICs and Systems, THERMINIC
SP - 115
EP - 120
BT - Collection of Papers Presented at The 13th International Workshop on THERMal INvestigation of Ics and Systems, THERMINIC 2007
T2 - 13th International Workshop on THERMal INvestigation of ICs and Systems, THERMINIC 2007
Y2 - 17 September 2007 through 19 September 2007
ER -