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Circuit analysis and optimization driven by worst-case distances
Kurt J. Antreich
, Helmut E. Graeb
, Claudia U. Wieser
Chair of Electronic Design Automation
Technical University of Munich
Research output
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Chapter in Book/Report/Conference proceeding
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Chapter
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Keyphrases
Optimization Approach
100%
Circuit Optimization
100%
Circuit Analysis
100%
Worst Case Distance
100%
Design Centering
66%
Computational Cost
33%
Operating Conditions
33%
Integrated Circuits
33%
Design Parameters
33%
Geometric Approach
33%
Worst-case Analysis
33%
Deterministic Method
33%
Circuit Design
33%
Transistor Model
33%
Integrated Circuit Design
33%
Circuit Simulator
33%
Specification Analysis
33%
Standard Circuit
33%
Yield Design
33%
Yield Optimization
33%
Deterministic Design
33%
Parametric Circuits
33%
Method Complexity
33%
Nominal Design
33%
Engineering
Model Parameter
100%
Fits and Tolerances
100%
Design Parameter
100%
Worst Case Analysis
100%
Electric Network Analysis
100%
Circuit Design
100%
Deterministic Design
100%
Integrated Circuit Design
100%
Computational Cost
100%
Integrated Circuit
100%