Chirp and linewidth enhancement factor of 1.55 μm VCSEL with buried tunnel junction

H. Halbritter, R. Shau, F. Riemenschneider, B. Kögel, M. Ortsiefer, J. Rosskopf, G. Böhm, M. Maute, M. C. Amann, P. Meissner

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Chirp characteristics of a 1.55 μm vertical-cavity surface-emitting laser (VCSEL) were analyzed using a buried tunnel junction. The linewidth enhancement factor αH was derived from the measurements. A high frequency modulation (FM) efficiency compared to edge emitters, was measured. It was shown that the carrier density modulation is flat over a broad frequency range (10 GHz/mW).

Original languageEnglish
Pages (from-to)1266-1268
Number of pages3
JournalElectronics Letters
Volume40
Issue number20
DOIs
StatePublished - 30 Sep 2004

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