Charged defects and defect-induced processes in nitrogen films

Elena Savchenko, Ivan Khyzhniy, Sergey Uyutnov, Andrey Barabashov, Galina Gumenchuk, Alexey Ponomaryov, Vladimir Bondybey

Research output: Contribution to journalArticlepeer-review

17 Scopus citations


Radiation effects in solid nitrogen irradiated with an electron beam were studied with emphasis on the role of charged centers in radiation-induced phenomena. The experiments were performed employing luminescence method and activation spectroscopy techniques - spectrally resolved thermally stimulated luminescence TSL and thermally stimulated exoelectron emission. Samples were probed in depth by varying electron energy, thus discriminating radiation-induced processes in the bulk and at the surface. Spectroscopic evidence of the excited N2* (C3Πu) molecule desorption was obtained for the first time and mechanism of the phenomenon based on recombination of electron with intrinsic charged center N4+ was proposed. The key role of N3+ center dissociative recombination in generation of N radicals is suggested.

Original languageEnglish
Pages (from-to)49-54
Number of pages6
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Issue number1-2
StatePublished - 1 Jan 2015


  • Electronic desorption
  • Nitrogen cations
  • Radiation effects


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