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Charge collection efficiency of an irradiated cryogenic double-p silicon detector

  • K. Borer
  • , S. Janos
  • , Z. Li
  • , B. Dezillie
  • , C. Da Viá
  • , V. Granata
  • , L. Casagrande
  • , R. W.I. De Boer
  • , C. Lourenço
  • , T. O. Niinikoski
  • , V. G. Palmieri
  • , S. Chapuy
  • , Z. Dimcovski
  • , E. Grigoriev
  • , W. Bell
  • , S. R.H. Devine
  • , G. Ruggiero
  • , V. O'Shea
  • , K. Smith
  • , P. Berglund
  • W. De Boer, F. Hauler, S. Heising, L. Jungermann, M. Abreu, P. Rato, P. Sousa, V. Cindro, M. Mikuz, M. Zavrtanik, A. Esposito, S. Paul, S. Buontempo, N. D'Ambrosio, S. Pagano, V. Eremin, E. Verbitskaya
  • University of Bern
  • Brookhaven National Laboratory
  • Brunel University London
  • European Organization for Nuclear Research
  • University of Geneva
  • University of Glasgow
  • Helsinki University of Technology
  • University of Karlsruhe
  • LIP - Lisboa
  • Jožef Stefan Institute
  • Technical University of Munich
  • Università di Napoli Federico II
  • The Russian Academy of Sciences

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We present results on the measurement of the charge collection efficiency of a p+/n/p+ silicon detector irradiated to 1 × 1015 n/cm2, operated in the temperature range between 80 and 200 K. For comparison, measurements obtained with a standard silicon diode (p+/n/n+), irradiated to the same fluence, are also presented. Both detectors show a dramatic increase of the CCE when operated at temperatures around 130 K. The double-p detector shows a higher CCE regardless of the applied bias and temperature, besides being symmetric with respect to the polarity of the bias voltage. At 130 K and 500 V applied bias the double-p detector shows a CCE of 80%, an unprecedented result for a silicon detector irradiated to such a high dose.

Original languageEnglish
Pages (from-to)474-483
Number of pages10
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume462
Issue number3
DOIs
StatePublished - 21 Apr 2001

Keywords

  • Cryogenic silicon detectors
  • Lazarus effect

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