Abstract
We present results on the measurement of the charge collection efficiency of a p+/n/p+ silicon detector irradiated to 1 × 1015 n/cm2, operated in the temperature range between 80 and 200 K. For comparison, measurements obtained with a standard silicon diode (p+/n/n+), irradiated to the same fluence, are also presented. Both detectors show a dramatic increase of the CCE when operated at temperatures around 130 K. The double-p detector shows a higher CCE regardless of the applied bias and temperature, besides being symmetric with respect to the polarity of the bias voltage. At 130 K and 500 V applied bias the double-p detector shows a CCE of 80%, an unprecedented result for a silicon detector irradiated to such a high dose.
| Original language | English |
|---|---|
| Pages (from-to) | 474-483 |
| Number of pages | 10 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
| Volume | 462 |
| Issue number | 3 |
| DOIs | |
| State | Published - 21 Apr 2001 |
Keywords
- Cryogenic silicon detectors
- Lazarus effect
Fingerprint
Dive into the research topics of 'Charge collection efficiency of an irradiated cryogenic double-p silicon detector'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver