Characterizing magnetic field-coupled computing devices by the Extraordinary Hall-effect

M. Becherer, J. Kiermaier, G. Csaba, J. Rezgani, C. Yilmaz, P. Osswald, P. Lugli, D. Schmitt-Landsiede

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

13 Scopus citations

Abstract

A submicron sized Extraordinary Hall-effect (EHE) sensor for read-out of field-coupled computing devices is presented. The applied sensing structure is suitable to electrically probe the output states of field-coupled magnetic logic gates. Furthermore it reveals details on the magnetic properties of submicron-scale single-domain dots. A 'split-current' architecture is chosen, where Hall-sensing takes place in a single lateral direction, in order to keep field-coupling to adjacent nanomagnets undisturbed. By focused ion beam (FIB) irradiation, the magnetic properties of Co/Pt muItilayers are tailored to define both the switching field and the geometry of nanomagnetic dots. From angular measurements we conclude, that the reversal mechanism of the FIB patterned magnetic dots remains to be domain-wall driven. The sensor is a main component needed for integration of nanomagnetic computing units embedded into microelectronic systems.

Original languageEnglish
Title of host publicationESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference
Pages105-108
Number of pages4
DOIs
StatePublished - 2009
Event39th European Solid-State Device Research Conference, ESSDERC 2009 - Athens, Greece
Duration: 14 Sep 200918 Sep 2009

Publication series

NameESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference

Conference

Conference39th European Solid-State Device Research Conference, ESSDERC 2009
Country/TerritoryGreece
CityAthens
Period14/09/0918/09/09

Fingerprint

Dive into the research topics of 'Characterizing magnetic field-coupled computing devices by the Extraordinary Hall-effect'. Together they form a unique fingerprint.

Cite this