Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device

Y. Kuznetsov; A. Baev; M. Konovalyuk; A. Gorbunova; M. Haider; J. A. Russer; P. Russer

doi:10.1109/EMCEurope.2018.8485054

Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device

Y. Kuznetsov, A. Baev, M. Konovalyuk, A. Gorbunova, M. Haider, J. A. Russer, P. Russer

Technical University of Munich

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

18 Scopus citations

Abstract

In this paper a methodology for the characterization of cyclostationary sources based on near-field time-domain measurements is proposed. The theory of the near-field scanning measurements over the equivalent Huygens' surface in parallel to the object plane of the PCB is presented. The theoretical background for the properties and characterization of the cyclostationary random processes is given. The space-time distributions of the cyclostationary sources over the equivalent Huygens surface of Intel Galileo Board is experimentally determined.

Original language	English
Title of host publication	EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	573-578
Number of pages	6
ISBN (Electronic)	9781467396974
DOIs	https://doi.org/10.1109/EMCEurope.2018.8485054
State	Published - 5 Oct 2018
Event	2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018 - Amsterdam, Netherlands Duration: 27 Aug 2018 → 30 Aug 2018

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
Volume	2018-August
ISSN (Print)	1077-4076
ISSN (Electronic)	2158-1118

Conference

Conference	2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018
Country/Territory	Netherlands
City	Amsterdam
Period	27/08/18 → 30/08/18

Keywords

correlation
electromagnetic compatibility
electromagnetic interference
magnetic field measurement
stochastic processes
time-domain analysis

Access to Document

10.1109/EMCEurope.2018.8485054

Cite this

Kuznetsov, Y., Baev, A., Konovalyuk, M., Gorbunova, A., Haider, M., Russer, J. A., & Russer, P. (2018). Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device. In EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility (pp. 573-578). Article 8485054 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2018-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMCEurope.2018.8485054

@inproceedings{c3c66541003e492c8680b3304f47d5a9,

title = "Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device",

abstract = "In this paper a methodology for the characterization of cyclostationary sources based on near-field time-domain measurements is proposed. The theory of the near-field scanning measurements over the equivalent Huygens' surface in parallel to the object plane of the PCB is presented. The theoretical background for the properties and characterization of the cyclostationary random processes is given. The space-time distributions of the cyclostationary sources over the equivalent Huygens surface of Intel Galileo Board is experimentally determined.",

keywords = "correlation, electromagnetic compatibility, electromagnetic interference, magnetic field measurement, stochastic processes, time-domain analysis",

author = "Y. Kuznetsov and A. Baev and M. Konovalyuk and A. Gorbunova and M. Haider and Russer, {J. A.} and P. Russer",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018 ; Conference date: 27-08-2018 Through 30-08-2018",

year = "2018",

month = oct,

day = "5",

doi = "10.1109/EMCEurope.2018.8485054",

language = "English",

series = "IEEE International Symposium on Electromagnetic Compatibility",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "573--578",

booktitle = "EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility",

}

Kuznetsov, Y, Baev, A, Konovalyuk, M, Gorbunova, A, Haider, M, Russer, JA & Russer, P 2018, Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device. in EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility., 8485054, IEEE International Symposium on Electromagnetic Compatibility, vol. 2018-August, Institute of Electrical and Electronics Engineers Inc., pp. 573-578, 2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018, Amsterdam, Netherlands, 27/08/18. https://doi.org/10.1109/EMCEurope.2018.8485054

Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device. / Kuznetsov, Y.; Baev, A.; Konovalyuk, M. et al.
EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., 2018. p. 573-578 8485054 (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2018-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device

AU - Kuznetsov, Y.

AU - Baev, A.

AU - Konovalyuk, M.

AU - Gorbunova, A.

AU - Haider, M.

AU - Russer, J. A.

AU - Russer, P.

PY - 2018/10/5

Y1 - 2018/10/5

N2 - In this paper a methodology for the characterization of cyclostationary sources based on near-field time-domain measurements is proposed. The theory of the near-field scanning measurements over the equivalent Huygens' surface in parallel to the object plane of the PCB is presented. The theoretical background for the properties and characterization of the cyclostationary random processes is given. The space-time distributions of the cyclostationary sources over the equivalent Huygens surface of Intel Galileo Board is experimentally determined.

AB - In this paper a methodology for the characterization of cyclostationary sources based on near-field time-domain measurements is proposed. The theory of the near-field scanning measurements over the equivalent Huygens' surface in parallel to the object plane of the PCB is presented. The theoretical background for the properties and characterization of the cyclostationary random processes is given. The space-time distributions of the cyclostationary sources over the equivalent Huygens surface of Intel Galileo Board is experimentally determined.

KW - correlation

KW - electromagnetic compatibility

KW - electromagnetic interference

KW - magnetic field measurement

KW - stochastic processes

KW - time-domain analysis

UR - http://www.scopus.com/inward/record.url?scp=85056138416&partnerID=8YFLogxK

U2 - 10.1109/EMCEurope.2018.8485054

DO - 10.1109/EMCEurope.2018.8485054

M3 - Conference contribution

AN - SCOPUS:85056138416

T3 - IEEE International Symposium on Electromagnetic Compatibility

SP - 573

EP - 578

BT - EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018

Y2 - 27 August 2018 through 30 August 2018

ER -

Kuznetsov Y, Baev A, Konovalyuk M, Gorbunova A, Haider M, Russer JA et al. Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device. In EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc. 2018. p. 573-578. 8485054. (IEEE International Symposium on Electromagnetic Compatibility). doi: 10.1109/EMCEurope.2018.8485054

Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this