Characterization of dielectric materials using partially loaded waveguide measurements

Emre Kiliç, Uwe Siart, Carsten H. Schmidt, Thomas F. Eibert

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Characterization of dielectric materials using partially loaded waveguide measurements'. Together they form a unique fingerprint.

Keyphrases

Material Science