Characterization of dielectric materials using partially loaded waveguide measurements

Emre Kiliç, Uwe Siart, Carsten H. Schmidt, Thomas F. Eibert

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

In this study, an iterative inversion algorithm for the determination of complex dielectric permittivity of non-magnetic, isotropic materials is presented. The dielectric sample to be measured is considered to load a rectangular waveguide partially. The inversion method is based on a fit between simulated and measured scattering parameters by Newton's technique. In order to obtain the simulated scattering parameters, a 3-D electromagnetic field solver is used to perform full-wave simulation of the problem under consideration. For validation of the proposed technique, estimated complex dielectric permittivities of three different materials at K-band are presented.

Original languageEnglish
Title of host publication2012 the 7th German Microwave Conference, GeMiC 2012
StatePublished - 2012
Event2012 the 7th German Microwave Conference, GeMiC 2012 - Ilmenau, Germany
Duration: 12 Mar 201214 Mar 2012

Publication series

Name2012 the 7th German Microwave Conference, GeMiC 2012

Conference

Conference2012 the 7th German Microwave Conference, GeMiC 2012
Country/TerritoryGermany
CityIlmenau
Period12/03/1214/03/12

Keywords

  • Material characterization
  • dielectric loaded waveguide

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