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Characterization of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli, Roberto Baccomi, Stefania Maria Beole, Mihail Bogdan Blidaru, Bent Benedikt Buttwill, Eric Buschmann, Paolo Camerini, Francesca Carnesecchi, Marielle Chartier, Yongjun Choi, Manuel Colocci, Giacomo Contin, Dominik Dannheim, Daniele De Gruttola, Manuel Del Rio Viera, Andrea Dubla, Antonello di Mauro, Maurice Calvin Donner
- European Organization for Nuclear Research
- University of Cagliari
- INFN- Sezione di Trieste
- University of Torino
- Heidelberg University
- University of Trieste Via A
- University of Liverpool
- University of Pusan
- Istituto Nazionale di Fisica Nucleare, Sezione di Bologna
- University of Salerno
- Deutsches Elektronen-Synchrotron (DESY)
- University of Bonn
- GSI Helmholtz Center
- University of Oxford
- Technical University of Munich
- University of Zurich
- VUB Neurology
- University of Birmingham
- Science Park 105
- Suranaree University of Technology
- Inha University
- Nuclear Physics Institute of the Cas
- Czech Technical University in Prague
- Synchrotron Light Research Institute
- Università di Catania
- Laboratori Nazionali Del Sud
- STFC Daresbury Laboratory
- Institut Pluridisciplinaire Hubert Curien
- University of Padova
- Johannes Gutenberg University
- Multimedia and Distributed Systems Laboratory
- University of Tübingen
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations