Characterization and optimization of electrooptic sampling by volume-integral-method and application of space-harmonic potential

M. Rottenkolber, W. Thomann, P. Russer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

The relationship between the electric field-components of planar microwave structures and optical fields of a Gaussian sampling-beam of an Electrooptic-Sampling-System for the case of direct probing or the use of an electrooptic probe tip are essential for the application of noncontact and noninvasive measurement of high-frequency integrated microwave circuits. The described volume-integral-method yields a rigorous treatment of the influence of the electrical field and the optical beam. In case of an external electrooptic probe tip a layered structure with a space-harmonic potential is investigated in detail and results on sensitivity and spatial resolution are presented.

Original languageEnglish
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherPubl by IEEE
Pages265-268
Number of pages4
ISBN (Print)0780312090
StatePublished - 1993
EventProceedings of the 1993 IEEE MTT-S International Microwave Symposium Digest, Part 1 (of 3) - Atlanta, GA, USA
Duration: 14 Jun 199318 Jun 1993

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume1
ISSN (Print)0149-645X

Conference

ConferenceProceedings of the 1993 IEEE MTT-S International Microwave Symposium Digest, Part 1 (of 3)
CityAtlanta, GA, USA
Period14/06/9318/06/93

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