TY - GEN
T1 - Challenges of Operationalizing Spectrum-Based Fault Localization from a Data-Centric Perspective
AU - Golagha, Mojdeh
AU - Pretschner, Alexander
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/4/13
Y1 - 2017/4/13
N2 - Fault localization is known to be tedious and expensive. To help practitioners reduce the needed effort, researchers have proposed many automated fault localization techniques over recent years. Spectrum-based fault localization techniques utilize the coverage data of test cases to localize faults. Although evaluations of these techniques show promising results, they are not being applied in practice yet. With this paper, we would like to stimulate discussions on challenges of operationalizing these techniques from a data-centric point of view. We describe the challenges we have encountered in our collaboration with industry. We also describe future plans.
AB - Fault localization is known to be tedious and expensive. To help practitioners reduce the needed effort, researchers have proposed many automated fault localization techniques over recent years. Spectrum-based fault localization techniques utilize the coverage data of test cases to localize faults. Although evaluations of these techniques show promising results, they are not being applied in practice yet. With this paper, we would like to stimulate discussions on challenges of operationalizing these techniques from a data-centric point of view. We describe the challenges we have encountered in our collaboration with industry. We also describe future plans.
UR - http://www.scopus.com/inward/record.url?scp=85018406919&partnerID=8YFLogxK
U2 - 10.1109/ICSTW.2017.69
DO - 10.1109/ICSTW.2017.69
M3 - Conference contribution
AN - SCOPUS:85018406919
T3 - Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017
SP - 379
EP - 381
BT - Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 10th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2017
Y2 - 13 March 2017 through 17 March 2017
ER -