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Bipolar magnetotransistor: Relative sensitivity revisited

  • ETH Zürich

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper we deduce and discuss a new analytical expression for the relative magnetic sensitivity Sr of bipolar magnetotransistors, which incorporates the ambipolar nature of the device operation in the description of the magnetic performance. Our expression accounts for the previously reported [1] trade-off between optimal electrical performance and maximum magnetic sensitivity, commonly found in bipolar magnetotransistors. Moreover, we are able to express Sr in terms of electrical parameters, such as emitter efficiency and common-emitter current gain, physical parameters, like minority carrier diffusion length or minority-carrier lifetime in the base region, and geometrical parameters, like the lateral spacing between emitter and collector.

Original languageEnglish
Title of host publicationEuropean Solid-State Device Research Conference
EditorsPeter Ashburn, Chris Hill
PublisherIEEE Computer Society
Pages71-74
Number of pages4
ISBN (Electronic)2863321579
StatePublished - 1994
Event24th European Solid State Device Research Conference, ESSDERC 1994 - Edinburgh, United Kingdom
Duration: 11 Sep 199415 Sep 1994

Publication series

NameEuropean Solid-State Device Research Conference
ISSN (Print)1930-8876

Conference

Conference24th European Solid State Device Research Conference, ESSDERC 1994
Country/TerritoryUnited Kingdom
CityEdinburgh
Period11/09/9415/09/94

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