Automating Greybox System-Level Test Generation

Denis Schwachhofer, Maik Betka, Steffen Becker, Stefan Wagner, Matthias Sauer, Ilia Polian

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations


System-Level Test (SLT) emerged as an additional test step to detect manufacturing defects not caught by traditional testing. For SLT, the Device Under Test (DUT) is embedded into an environment that emulates the end-user application as closely as possible and runs workloads composed of existing off-The-shelf software. We present an automatic greybox SLT program generation method to find code snippets that control the DUT's extra-functional properties, to achieve better characterization, or to improve the coverage of emerging defect types. In contrast to ATPG or formal methods, our method does not require structural information and relies solely on simulation results or hardware measurements to guide the generation. We show that our method outperforms hand-crafted snippets on a RISC-V super-scalar processor and look into possible reasons why the snippets perform the way they do.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE European Test Symposium, ETS 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350336344
StatePublished - 2023
Externally publishedYes
Event28th IEEE European Test Symposium, ETS 2023 - Venice, Italy
Duration: 22 May 202326 May 2023

Publication series

NameProceedings of the European Test Workshop
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780


Conference28th IEEE European Test Symposium, ETS 2023


  • greybox testing
  • hardware test
  • reliability
  • System-Level Test
  • test generation


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