TY - GEN
T1 - Automatic timed automata extraction from ladder programs for model-based analysis of control systems
AU - De Vasconcelos Oliveira, Kézia
AU - Da Silva, Leandro Dias
AU - Perkusich, Angelo
AU - Lima, Antônio Marcus Nogueira
AU - Gorgônio, Kyller
PY - 2010
Y1 - 2010
N2 - Control systems are used to produce a certain result with little or no human supervision. The principal aim of such systems is to ensure that resources are used efficiently and that the desired product quality is achieved. Moreover, for critical systems such as oil and gas plants, it is important to guarantee the safety and reliability of the operation. Therefore, it is necessary to verify whether what is running in the device is in accordance with what was defined in the specification documents. The goal of this work is to present a method that automatically generates the timed automata models from the specification ISA 5.2 Binary Logic Diagrams, and the implementation Ladder programs, for model-based analysis, in order to increase the dependability in the behavior of critical control systems. This approach is based on the use of the Uppaal tool and the Uppaal-TRON testing tool.
AB - Control systems are used to produce a certain result with little or no human supervision. The principal aim of such systems is to ensure that resources are used efficiently and that the desired product quality is achieved. Moreover, for critical systems such as oil and gas plants, it is important to guarantee the safety and reliability of the operation. Therefore, it is necessary to verify whether what is running in the device is in accordance with what was defined in the specification documents. The goal of this work is to present a method that automatically generates the timed automata models from the specification ISA 5.2 Binary Logic Diagrams, and the implementation Ladder programs, for model-based analysis, in order to increase the dependability in the behavior of critical control systems. This approach is based on the use of the Uppaal tool and the Uppaal-TRON testing tool.
UR - http://www.scopus.com/inward/record.url?scp=78650377183&partnerID=8YFLogxK
U2 - 10.1109/ISIE.2010.5637890
DO - 10.1109/ISIE.2010.5637890
M3 - Conference contribution
AN - SCOPUS:78650377183
SN - 9781424463916
T3 - IEEE International Symposium on Industrial Electronics
SP - 90
EP - 95
BT - ISIE 2010 - 2010 IEEE International Symposium on Industrial Electronics
T2 - 2010 IEEE International Symposium on Industrial Electronics, ISIE 2010
Y2 - 4 July 2010 through 7 July 2010
ER -