TY - GEN
T1 - AutoBench
T2 - 6th ACM/IEEE International Symposium on Machine Learning for CAD, MLCAD 2024
AU - Qiu, Ruidi
AU - Zhang, Grace Li
AU - Drechsler, Rolf
AU - Schlichtmann, Ulf
AU - Li, Bing
N1 - Publisher Copyright:
© 2024 Owner/Author.
PY - 2024/9/9
Y1 - 2024/9/9
N2 - In digital circuit design, testbenches (TBs) constitute the cornerstone of simulation-based hardware verification. Traditional methodologies for testbench generation during simulation-based hardware verification still remain partially manual, resulting in inefficiencies in te sting various sc enarios an d re quiring expensive time from designers. Large Language Models (LLMs) have demonstrated their potential in automating the circuit design flow. However, directly applying LLMs to generate testbenches suffers from a low pass rate. To address this challenge, we introduce Auto-Bench, the first LLM-based testbench generator for digital circuit design, which requires only the description of the design under test (DUT) to automatically generate comprehensive testbenches. In AutoBench, a hybrid testbench structure and a self-checking system are realized using LLMs. To validate the generated test-benches, we also introduce an automated testbench evaluation framework to evaluate the quality of generated testbenches from multiple perspectives. Experimental results demonstrate that Auto-Bench achieves a 57% improvement in the testbench pass@l ratio compared with the baseline that directly generates testbenches using LLMs. For 75 sequential circuits, AutoBench successfully has a 3.36 times testbench pass@l ratio compared with the baseline. The source codes and experimental results are open-sourced at this link: https://github.com/AutoBench/AutoBench. Artifact DOI: 10.5281/zenodo.13325723.
AB - In digital circuit design, testbenches (TBs) constitute the cornerstone of simulation-based hardware verification. Traditional methodologies for testbench generation during simulation-based hardware verification still remain partially manual, resulting in inefficiencies in te sting various sc enarios an d re quiring expensive time from designers. Large Language Models (LLMs) have demonstrated their potential in automating the circuit design flow. However, directly applying LLMs to generate testbenches suffers from a low pass rate. To address this challenge, we introduce Auto-Bench, the first LLM-based testbench generator for digital circuit design, which requires only the description of the design under test (DUT) to automatically generate comprehensive testbenches. In AutoBench, a hybrid testbench structure and a self-checking system are realized using LLMs. To validate the generated test-benches, we also introduce an automated testbench evaluation framework to evaluate the quality of generated testbenches from multiple perspectives. Experimental results demonstrate that Auto-Bench achieves a 57% improvement in the testbench pass@l ratio compared with the baseline that directly generates testbenches using LLMs. For 75 sequential circuits, AutoBench successfully has a 3.36 times testbench pass@l ratio compared with the baseline. The source codes and experimental results are open-sourced at this link: https://github.com/AutoBench/AutoBench. Artifact DOI: 10.5281/zenodo.13325723.
KW - Hardware Simulation
KW - Large Language Model
KW - Testbench Generation
UR - https://www.scopus.com/pages/publications/85204946313
U2 - 10.1145/3670474.3685956
DO - 10.1145/3670474.3685956
M3 - Conference contribution
AN - SCOPUS:85204946313
T3 - MLCAD 2024 - Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD
BT - MLCAD 2024 - Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD
PB - Association for Computing Machinery, Inc
Y2 - 9 September 2024 through 11 September 2024
ER -