Atomistic investigation of surface characteristics and electronic features at high-purity FeSi(110) presenting interfacial metallicity

  • Biao Yang
  • , Martin Uphoff
  • , Yi Qi Zhang
  • , Joachim Reichert
  • , Ari Paavo Seitsonen
  • , Andreas Bauer
  • , Christian Pfleiderer
  • , Johannes V. Barth

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Iron silicide (FeSi) is a fascinating material that has attracted extensive research efforts for decades, notably revealing unusual temperature-dependent electronic and magnetic characteristics, as well as a close resemblance to the Kondo insulators whereby a coherent picture of intrinsic properties and underlying physics remains to be fully developed. For a better understanding of this narrow-gap semiconductor, we prepared and examined FeSi(110) single-crystal surfaces of high quality. Combined insights from low-temperature scanning tunneling microscopy and density functional theory calculations (DFT) indicate an unreconstructed surface termination presenting rows of Fe–Si pairs. Using high-resolution tunneling spectroscopy (STS), we identify a distinct asymmetric electronic gap in the sub-10 K regime on defect-free terraces. Moreover, the STS data reveal a residual density of states in the gap regime whereby two in-gap states are recognized. The principal origin of these features is rationalized with the help of the DFT-calculated band structure. The computational modeling of a (110)-oriented slab notably evidences the existence of interfacial intragap bands accounting for a markedly increased density of states around the Fermi level. These findings support and provide further insight into the emergence of surface metallicity in the low-temperature regime.

Original languageEnglish
Article numbere2021203118
JournalProceedings of the National Academy of Sciences of the United States of America
Volume118
Issue number17
DOIs
StatePublished - 27 Apr 2021

Keywords

  • Correlated electrons
  • In-gap state
  • Iron silicide
  • Scanning tunneling microscopy
  • Surface conductivity

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