Atomic force microscopy of DNA on mica and chemically modified mica

T. Thundat; D. P. Allison; R. J. Warmack; G. M. Brown; K. B. Jacobson; J. J. Schrick; T. L. Ferrell; E. Henderson; W. Heckl; S. M. Lindsay

Atomic force microscopy of DNA on mica and chemically modified mica

T. Thundat, D. P. Allison, R. J. Warmack, G. M. Brown, K. B. Jacobson, J. J. Schrick, T. L. Ferrell, E. Henderson, W. Heckl, S. M. Lindsay

Oak Ridge National Laboratory

Research output: Contribution to journal › Article › peer-review

90 Scopus citations

Abstract

Atomic force microscopy (AFM) was used to image circular DNA adsorbed on freshly cleaved mica and mica chemically modified with Mg(II), Co(II), La(III), and Zr(IV). Images obtained on unmodified mica show coiling of DNA due to forces involved during the drying process. The coiling or super twisting appeared to be right handed and the extent of super twisting could be controlled by the drying conditions. Images of DNA observed on chemically modified surfaces show isolated open circular DNA that is free from super twisting, presumably due to strong binding of DNA on chemically modified surfaces.

Original language	English
Pages (from-to)	911-918
Number of pages	8
Journal	Scanning Microscopy
Volume	6
Issue number	4
State	Published - Dec 1992
Externally published	Yes

Cite this

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title = "Atomic force microscopy of DNA on mica and chemically modified mica",

abstract = "Atomic force microscopy (AFM) was used to image circular DNA adsorbed on freshly cleaved mica and mica chemically modified with Mg(II), Co(II), La(III), and Zr(IV). Images obtained on unmodified mica show coiling of DNA due to forces involved during the drying process. The coiling or super twisting appeared to be right handed and the extent of super twisting could be controlled by the drying conditions. Images of DNA observed on chemically modified surfaces show isolated open circular DNA that is free from super twisting, presumably due to strong binding of DNA on chemically modified surfaces.",

author = "T. Thundat and Allison, {D. P.} and Warmack, {R. J.} and Brown, {G. M.} and Jacobson, {K. B.} and Schrick, {J. J.} and Ferrell, {T. L.} and E. Henderson and W. Heckl and Lindsay, {S. M.}",

year = "1992",

month = dec,

language = "English",

volume = "6",

pages = "911--918",

journal = "Scanning Microscopy",

issn = "0891-7035",

publisher = "Scanning Microscopy International",

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TY - JOUR

T1 - Atomic force microscopy of DNA on mica and chemically modified mica

AU - Thundat, T.

AU - Allison, D. P.

AU - Warmack, R. J.

AU - Brown, G. M.

AU - Jacobson, K. B.

AU - Schrick, J. J.

AU - Ferrell, T. L.

AU - Henderson, E.

AU - Heckl, W.

AU - Lindsay, S. M.

PY - 1992/12

Y1 - 1992/12

N2 - Atomic force microscopy (AFM) was used to image circular DNA adsorbed on freshly cleaved mica and mica chemically modified with Mg(II), Co(II), La(III), and Zr(IV). Images obtained on unmodified mica show coiling of DNA due to forces involved during the drying process. The coiling or super twisting appeared to be right handed and the extent of super twisting could be controlled by the drying conditions. Images of DNA observed on chemically modified surfaces show isolated open circular DNA that is free from super twisting, presumably due to strong binding of DNA on chemically modified surfaces.

AB - Atomic force microscopy (AFM) was used to image circular DNA adsorbed on freshly cleaved mica and mica chemically modified with Mg(II), Co(II), La(III), and Zr(IV). Images obtained on unmodified mica show coiling of DNA due to forces involved during the drying process. The coiling or super twisting appeared to be right handed and the extent of super twisting could be controlled by the drying conditions. Images of DNA observed on chemically modified surfaces show isolated open circular DNA that is free from super twisting, presumably due to strong binding of DNA on chemically modified surfaces.

UR - http://www.scopus.com/inward/record.url?scp=0027090278&partnerID=8YFLogxK

M3 - Article

C2 - 1295085

AN - SCOPUS:0027090278

SN - 0891-7035

VL - 6

SP - 911

EP - 918

JO - Scanning Microscopy

JF - Scanning Microscopy

IS - 4

ER -

Atomic force microscopy of DNA on mica and chemically modified mica

Abstract

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