Artifact-free deconvolution in light field microscopy

Anca Stefanoiu, Josue Page, Panagiotis Symvoulidis, Gil G. Westmeyer, Tobias Lasser

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

The sampling patterns of the light field microscope (LFM) are highly depth-dependent, which implies non-uniform recoverable lateral resolution across depth. Moreover, reconstructions using state-of-the-art approaches suffer from strong artifacts at axial ranges, where the LFM samples the light field at a coarse rate. In this work, we analyze the sampling patterns of the LFM, and introduce a flexible light field point spread function model (LFPSF) to cope with arbitrary LFM designs. We then propose a novel aliasing-aware deconvolution scheme to address the sampling artifacts. We demonstrate the high potential of the proposed method on real experimental data.

Original languageEnglish
Pages (from-to)31644-31666
Number of pages23
JournalOptics Express
Volume27
Issue number22
DOIs
StatePublished - 28 Oct 2019

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