Analysis of Piezoresistive Silicon as Sense Element for use in Flexible Tactile Sensors

Vartika Verma, Eslam Ahmed, Nicola Kovac, Christof Landesberger, Horst Gieser, Ralf Brederlow

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents the bending analysis of stress-sensor chips of 300 μm and 100 μm thickness. Previous work on similar topics is usually heavily focused on ultra-thin chips (≤20 μm) and their reliability analysis for flexible applications. This paper aims to prove that flexible tactile sensors can be made using silicon resistors as the primary stress elements and can demonstrate good results even at intermediate thickness levels. The silicon resistors show a linear temperature response and can be oriented to have directional stress sensitivity, proving superior to other organic sensors. The motivation behind this research is to make the tactile sensor solely using CMOS circuits and, therefore, integrate both the sensor and the readout circuitry in one chip. This is extremely useful if the tactile sensors are used on a large scale and must be fabricated commercially using existing infrastructure.

Original languageEnglish
Title of host publication2024 IEEE Sensors, SENSORS 2024 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350363517
DOIs
StatePublished - 2024
Event2024 IEEE Sensors, SENSORS 2024 - Kobe, Japan
Duration: 20 Oct 202423 Oct 2024

Publication series

NameProceedings of IEEE Sensors
ISSN (Print)1930-0395
ISSN (Electronic)2168-9229

Conference

Conference2024 IEEE Sensors, SENSORS 2024
Country/TerritoryJapan
CityKobe
Period20/10/2423/10/24

Keywords

  • chip-on-foil (CoF)
  • CMOS Stress sensor
  • flexible electronics
  • hybrid integration
  • piezoresistive sensor

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