An optical and electrochemical investigation of ZrO₂ thin films (from NM to MM thickness)

Keyphrases

• Yttria-stabilized Zirconia 100%
• Electrochemical Investigation 100%
• ZrO2 Thin Films 100%
• Optical Investigations 100%
• Zirconia Film 75%
• Band Gap 50%
• Impedance Spectroscopy 50%
• Zirconium Dioxide 50%
• Bulk Material 25%
• Dielectric Properties 25%
• Thick Film 25%
• Single Crystal 25%
• Low Temperature 25%
• Characterization Techniques 25%
• Film Thickness 25%
• Optical Techniques 25%
• Reflectance Spectroscopy 25%
• Electrochemical Techniques 25%
• Reflectance Spectra 25%
• Polarization Resistance 25%
• Photoelectrochemistry 25%
• Transmission Spectrum 25%
• Localized States 25%
• Relative Amount 25%
• Tape Casting 25%
• Electrophoretic Deposition 25%
• Photoelectrochemical Studies 25%
• Transmittance Spectroscopy 25%
• Grain Resistance 25%
• Inter-grain 25%
• Zirconium Oxide Films 25%
• Electric Field (E-field) 25%
• Yttria-stabilized Zirconia Thin Films 25%

Material Science

• Film 100%
• Zirconia 100%
• Yttria Stabilized Zirconia 100%
• Thin Films 100%
• Dielectric Spectroscopy 40%
• Dielectric Property 20%
• Film Thickness 20%
• Chemical Vapor Deposition 20%
• Oxide Film 20%
• Electrochemical Reaction 20%
• Tape Casting 20%
• Electrophoretic Deposition 20%
• Thick Films 20%
• Surface (Surface Science) 20%
• Single Crystal 20%

Engineering

• Thin Films 100%
• Yttria-Stabilized Zirconia 100%
• Band Gap 40%
• Bulk Material 20%
• Dielectrics 20%
• Chemical Vapor Deposition 20%
• Low-Temperature 20%
• Information Gain 20%
• Electrochemical Technique 20%
• Reflectance Spectrum 20%
• Localized State 20%
• Oxide Film 20%
• Reflectance 20%
• Electric Field 20%