TY - GEN
T1 - An evaluation of two bug pattern tools for Java
AU - Wagner, Stefan
AU - Deissenboeck, Florian
AU - Aichner, Michael
AU - Wimmer, Johann
AU - Schwalb, Markus
PY - 2008
Y1 - 2008
N2 - Automated static analysis is a promising technique to detect defects in software. However, although considerable effort has been spent for developing sophisticated detection possibilities, the effectiveness and efficiency has not been treated in equal detail. This paper presents the results of two industrial case studies in which two tools based on bug patterns for Java are applied and evaluated. First, the economic implications of the tools are analysed. It is estimated that only 3-4 potential field defects need to be detected for the tools to be cost-efficient. Second, the capabilities of detecting field defects are investigated. No field defects have been found that could have been detected by the tools. Third, the identification of fault-prone classes based on the results of such tools is investigated and found to be possible. Finally, methodological consequences are derived from the results and experiences in order to improve the use of bug pattern tools in practice.
AB - Automated static analysis is a promising technique to detect defects in software. However, although considerable effort has been spent for developing sophisticated detection possibilities, the effectiveness and efficiency has not been treated in equal detail. This paper presents the results of two industrial case studies in which two tools based on bug patterns for Java are applied and evaluated. First, the economic implications of the tools are analysed. It is estimated that only 3-4 potential field defects need to be detected for the tools to be cost-efficient. Second, the capabilities of detecting field defects are investigated. No field defects have been found that could have been detected by the tools. Third, the identification of fault-prone classes based on the results of such tools is investigated and found to be possible. Finally, methodological consequences are derived from the results and experiences in order to improve the use of bug pattern tools in practice.
UR - https://www.scopus.com/pages/publications/50549089646
U2 - 10.1109/ICST.2008.63
DO - 10.1109/ICST.2008.63
M3 - Conference contribution
AN - SCOPUS:50549089646
SN - 076953127X
SN - 9780769531274
T3 - Proceedings of the 1st International Conference on Software Testing, Verification and Validation, ICST 2008
SP - 248
EP - 257
BT - Proceedings of the 1st International Conference on Software Testing, Verification and Validation, ICST 2008
T2 - 1st International Conference on Software Testing, Verification and Validation, ICST 2008
Y2 - 9 April 2008 through 11 April 2008
ER -