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An energy-efficient supply voltage scheme using in-situ Pre-Error detection for on-the-fly voltage adaptation to PVT variations

  • Technical University of Munich
  • Infineon Technologies AG

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

The presented Pre-Error voltage scheme dynamically tunes the supply voltage of digital circuits, according to PVT variations. By exploiting unused timing margin, produced by state-of-the-art worst-case designs, power consumption is minimized. Pre-Error flip-flops detect late-arriving signals in critical paths for the pre-error rate driven voltage adaptation. We use a Markov chain model to describe the voltage scheme analytically and analyze the effect of global and local variations on the closed-loop control. For an arithmetic circuit, synthesized in an industrial 65nm design-flow, an average power saving of 23% is achieved for very low error rates below 1E-11.

Original languageEnglish
Title of host publication2011 International Symposium on Integrated Circuits, ISIC 2011
Pages94-97
Number of pages4
DOIs
StatePublished - 2011
Event2011 International Symposium on Integrated Circuits, ISIC 2011 - SingaporeSingapore, Singapore
Duration: 12 Dec 201114 Dec 2011

Publication series

Name2011 International Symposium on Integrated Circuits, ISIC 2011

Conference

Conference2011 International Symposium on Integrated Circuits, ISIC 2011
Country/TerritorySingapore
CitySingaporeSingapore
Period12/12/1114/12/11

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