@inproceedings{0594384c19964815a1974e7d939ca0de,
title = "An efficient High-Volume Production Performance Screening using On-Chip Ring Oscillators",
abstract = "Performance screening is an essential test for modern automotive microcontrollers (MCUs). Such a test determines the maximum achievable frequency FMAX of the MCU. On-chip ring oscillators (ROs) are used as indirect monitors for performance screening. The performance is determined by using the RO frequencies. This work uses various ROs to train a classification-based machine learning model that does a pass/fail classification based on a preset threshold value. An accuracy of over 97 % is achieved. The proposed performance screening flow selects the most appropriate subset of ROs and extracts sharp test limits that are directly applicable to the productive test flow.",
author = "Tobias Kilian and Abhishek Sengupta and Daniel Tille and Martin Huch and Ulf Schlichtmann",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 ; Conference date: 03-10-2023 Through 05-10-2023",
year = "2023",
doi = "10.1109/DFT59622.2023.10313542",
language = "English",
series = "Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Luca Cassano and Mihalis Psarakis and Marcello Traiola and Alberto Bosio",
booktitle = "36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023",
}