An analysis of industrial SRAM test results - A comprehensive study on effectiveness and classification of march test algorithms

Michael Linder; Alfred Eder; Ulf Schlichtmann; Klaus Oberländer

doi:10.1109/MDAT.2013.2279752

An analysis of industrial SRAM test results - A comprehensive study on effectiveness and classification of march test algorithms

Michael Linder, Alfred Eder, Ulf Schlichtmann, Klaus Oberländer

Chair of Electronic Design Automation

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Editor's notes: This paper deals with efficient test algorithm identification of embedded SRAMs. The approach is based on silicon test results of automotive microcontroller devices, which tries to identify efficient tests by removing unnecessary test patterns that cover the same subset of faults. Results of an industrial case under 29 test algorithms and a large amount of chips are obtained; among them, efficient ones are identified.

Original language	English
Article number	6587484
Pages (from-to)	42-53
Number of pages	12
Journal	IEEE Design and Test
Volume	31
Issue number	3
DOIs	https://doi.org/10.1109/MDAT.2013.2279752
State	Published - Jun 2014

Keywords

Classification
Functional Fault Models
March Algorithms
SRAM test

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10.1109/MDAT.2013.2279752

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An analysis of industrial SRAM test results - A comprehensive study on effectiveness and classification of march test algorithms

Abstract

Keywords

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