TY - GEN
T1 - An aging suppression and calibration approach for differential amplifiers in advanced CMOS technologies
AU - Chouard, Florian Raoul
AU - More, Shailesh
AU - Fulde, Michael
AU - Schmitt-Landsiedel, Doris
PY - 2011
Y1 - 2011
N2 - Stress experiments are presented on analog size devices in inversion and accumulation mode, including relaxing stress phenomena. Based on these data, a general concept to suppress device aging impact on differential amplifier circuits in advanced CMOS technologies is presented and proven experimentally. It is shown that the proposed method also enables to compensate for process variation induced mismatch. Thus it provides analog circuit designers the opportunity to reduce matching related area requirements.
AB - Stress experiments are presented on analog size devices in inversion and accumulation mode, including relaxing stress phenomena. Based on these data, a general concept to suppress device aging impact on differential amplifier circuits in advanced CMOS technologies is presented and proven experimentally. It is shown that the proposed method also enables to compensate for process variation induced mismatch. Thus it provides analog circuit designers the opportunity to reduce matching related area requirements.
UR - http://www.scopus.com/inward/record.url?scp=82955194794&partnerID=8YFLogxK
U2 - 10.1109/ESSCIRC.2011.6044954
DO - 10.1109/ESSCIRC.2011.6044954
M3 - Conference contribution
AN - SCOPUS:82955194794
SN - 9781457707018
T3 - European Solid-State Circuits Conference
SP - 251
EP - 254
BT - ESSCIRC 2011 - Proceedings of the 37th European Solid-State Circuits Conference
T2 - 37th European Solid-State Circuits Conference, ESSCIRC 2011
Y2 - 12 September 2011 through 16 September 2011
ER -