An advanced magnetic reflectometer

Sebastian Brück; Steffen Bauknecht; Bernd Ludescher; Eberhard Goering; Gisela Schütz

doi:10.1063/1.2970941

An advanced magnetic reflectometer

Sebastian Brück
, Steffen Bauknecht
, Bernd Ludescher
, Eberhard Goering
, Gisela Schütz

Max Planck Institute for Intelligent Systems

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and magnetic depth profiles of layered thin-film samples. This new diffractometer is optimized for a broad variety of sample systems. Therefore a balanced design focusing on high magnetic fields, low temperatures, and full freedom of rotation has been realized in UHV. First experimental results obtained on a NiCoO/Co bilayer sample are presented showing the potential of the setup.

Original language	English
Article number	083109
Journal	Review of Scientific Instruments
Volume	79
Issue number	8
DOIs	https://doi.org/10.1063/1.2970941
State	Published - 2008
Externally published	Yes

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10.1063/1.2970941

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abstract = "A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and magnetic depth profiles of layered thin-film samples. This new diffractometer is optimized for a broad variety of sample systems. Therefore a balanced design focusing on high magnetic fields, low temperatures, and full freedom of rotation has been realized in UHV. First experimental results obtained on a NiCoO/Co bilayer sample are presented showing the potential of the setup.",

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year = "2008",

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journal = "Review of Scientific Instruments",

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T1 - An advanced magnetic reflectometer

AU - Brück, Sebastian

AU - Bauknecht, Steffen

AU - Ludescher, Bernd

AU - Goering, Eberhard

AU - Schütz, Gisela

PY - 2008

Y1 - 2008

N2 - A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and magnetic depth profiles of layered thin-film samples. This new diffractometer is optimized for a broad variety of sample systems. Therefore a balanced design focusing on high magnetic fields, low temperatures, and full freedom of rotation has been realized in UHV. First experimental results obtained on a NiCoO/Co bilayer sample are presented showing the potential of the setup.

AB - A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and magnetic depth profiles of layered thin-film samples. This new diffractometer is optimized for a broad variety of sample systems. Therefore a balanced design focusing on high magnetic fields, low temperatures, and full freedom of rotation has been realized in UHV. First experimental results obtained on a NiCoO/Co bilayer sample are presented showing the potential of the setup.

UR - https://www.scopus.com/pages/publications/50849110482

U2 - 10.1063/1.2970941

DO - 10.1063/1.2970941

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SN - 0034-6748

VL - 79

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 8

M1 - 083109

ER -

An advanced magnetic reflectometer

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